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CMP Technology: Competition, Products, Markets

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出版日期:2014/12/09

Chapter 1    Introduction                                                                 1-1

 

Chapter 2                                                                                        Executive Summary    2-1

 

2.1    Introduction                                                                             2-1

2.2     Market Opportunities                                                                2-9

 

Chapter 3                                                                                        Planarization Methods          3-1

 

3.1     Need for Planarity                                                                     3-1

          3.1.1  Lithography                                                                    3-4

          3.1.2  Deposition                                                                      3-6

          3.1.3  Etching                                                                           3-10

3.2     Applications                                                                             3-13

          3.2.1  Dielectrics                                                                       3-13

          3.2.2  Metals                                                                            3-15

3.3     Planarization Techniques                                                          3-17

          3.3.1  Local Planarization                                                          3-17

                   3.3.1.1  Deposition-Etchback                                         3-17

                   3.3.1.2  ECR                                                                  3-19

                   3.3.1.3  Oxide Reflow                                                    3-19

                   3.3.1.4  Spin-on-Glass                                                    3-20

                   3.3.1.5  TEOS-Ozone                                                     3-20

                   3.3.1.6  Laser                                                                 3-21

          3.3.2  Global Planarization                                                        3-22

                   3.3.2.1  Spin-On Polymer                                               3-22

                   3.3.2.2  Polyimide Coating                                             3-24

                   3.3.2.3  Isotropic Etch                                                    3-24

                   3.3.2.4  Spin Etch Planarization                                     3-25

                   3.3.2.5  Electropolishing                                                3-26

3.4     CMP                                                                                        3-28

          3.4.1  Background                                                                    3-33

          3.4.2  Research Efforts                                                              3-34

          3.4.3  Advantages and Disadvantages                                        3-35

          3.4.4  Process Parameters                                                          3-37

                   3.4.4.1  STI Planarization                                               3-39

                   3.4.4.2  Copper CMP                                                     3-43

3.4.4.3  Low-K Integration                                             3-57

                   3.4.4.4  Defect Density                                                  3-69

                   3.4.4.5  Metrology                                                         3-71

          3.4.5  Device Processing Parameters                                          3-85

                   3.4.5.1  Memory Devices                                               3-85

                   3.4.5.2  Logic Devices                                                    3-86

 

Chapter 4                                                                                        CMP Consumables     4-1

 

4.1     Slurries                                                                                     4-1

          4.1.1  Types                                                                              4-1

          4.1.2  pH Effects                                                                       4-7

          4.1.3  Oxidizers                                                                        4-10

          4.1.4  Particle Morphology Effects                                             4-11

          4.1.5  Chemical Distribution Management                                4-13

          4.1.6  Slurry Supplier Profiles                                                    4-18

          4.1.7  Abrasive Suppliers                                                           4-32

4.2     Post-CMP Clean                                                                       4-36

4.3     Polishing Pads                                                                          4-42

          4.3.1  Types                                                                              4-42

          4.3.2  Performance                                                                    4-43

          4.3.3  Slurryless Pads                                                                4-49

 

 

 

 

 

Chapter 5                                                                                        CMP Equipment  5-1

 

5.1     Single-Head Approach                                                              5-1

          5.1.1  Advantages                                                                     5-1

          5.1.2  Disadvantages                                                                 5-3

5.2     Multi-Head Approach                                                               5-4

          5.2.1  Advantages                                                                     5-4

          5.2.2  Disadvantages                                                                 5-5

5.3     Equipment Profiles                                                                   5-6

          5.3.1  Applied Materials                                                            5-7

          5.3.2  Ebara                                                                              5-8

          5.3.3  Strasbaugh                                                                      5-9

          5.3.4  Novellus                                                                         5-9

          5.3.5  Nikon                                                                             5-10

          5.3.6  Doosan Mecatec                                                              5-11

          5.3.7  Other Entrants                                                                5-11

5.4     Clustered Tools                                                                         5-12

5.5     Competitive Non-CMP Tools                                                    5-15

 

Chapter 6    User Issues                                                                     6-1

 

6.1     Cost of Ownership                                                                    6-1

6.2     User Requirements                                                                   6-7

6.3     Benchmarking a Vendor                                                           6-10

          6.3.1  Pricing                                                                            6-10

          6.3.2  Vendor Commitment and Attitudes                                 6-12

          6.3.3  Vendor Capabilities                                                         6-13

          6.3.4  System Capabilities                                                         6-15

6.4     User-Supplier Synergy                                                              6-16

          6.4.1  Feedback During Equipment Evaluation                          6-16

          6.4.2  Feedback During Device Production                                6-17

6.5     Reliability                                                                                 6-18

6.6     Equipment Maintainability                                                       6-19

 

Chapter 7                                                                                        Market Forecast   7-1

 

7.1     Introduction                                                                             7-1

7.2     Market Forecast Assumptions                                                   7-4

7.3     Equipment Market                                                                    7-5

          7.3.1  Introduction                                                                    7-5

          7.3.2  CMP Polisher Market                                                      7-6

7.4     Consumable Market                                                                  7-11

          7.4.1  Slurry                                                                             7-11

          7.4.2  Pads                                                                                7-21


LIST OF FIGURES

 

                                                                                                         Page

 

1.1     Process Integration for CMP                                                      1-2

3.1     Planarization Lengths of Various Methods                                 3-18

3.2     Normalized Removal Rates                                                       3-29

3.3     Reduced Complexity With Copper                                             3-45

3.4     Copper Loss From CMP                                                            3-50

3.5     CMP Copper Process Technologies                                            3-52

3.6     CMP Performance Improvements                                              3-54

3.7     Polish Endpoint Control                                                            3-83

4.1     Effect of Nitrate Ions on the Cu Removal Rate                          4-8

4.2     Removal Rate of Ta                                                                  4-9

4.3     Bulk Chemical Distribution System                                          4-15

4.4   Through The Brush Chemical Delivery                                     4-68

4.5    Megasonics Post-CMP Clean                                                     4-40

4.6  Micrograph Of 3M Slurryless Pad                                             4-51

6.1     Effect of Tool MTBF on CMP Cost                                           6-5

6.2     Removal Rate Vs Throughput and CMP Cost                            6-6

7.1     Worldwide CMP Polisher Market                                               7-8

7.2     Worldwide CMP Slurry Market Forecast                                    7-13

7.3     CMP Slurry Market by Application                                            7-15

7.4     ILD Slurry Market Share                                                           7-16

7.5     STI Slurry Market Share                                                           7-17

7.6     Copper Barrier Slurry Market Share                                           7-18

7.7     Copper Step 1 Slurry Market Share                                            7-19

7.8     Worldwide CMP Pad Market Forecast                                        7-23

7.9     CMP PAD Market Shares                                                          7-24

 

 

 


LIST OF TABLES

 

                                                                                                         Page

 

3.1     Levels of Integration of Dynamic Rams                                     3-2

3.2     Interconnect Levels of Logic Device                                          3-3

3.3     Typical Process Specifications                                                   3-12

3.4     Organic Polymers for IMD Applications                                    3-23

3.5  CMP Process Variables                                                              3-31

3.6     Optimized CMP and Post-CMP Clean Parameters                      3-39

3.7     Interconnect Materials by Segment                                           3-48

4.1     CMP Slurry Suppliers                                                               4-19

4.2     Abrasive Suppliers and Products                                                4-35

4.2     Oxide CMP Pad Properties and Performance                              4-44

6.1     Polisher Equipment Targets                                                      6-8

6.2     Post-CMP Clean Equipment Targets                                          6-9

7.1     Worldwide CMP Polisher Market Forecast                                 7-7

7.2     Worldwide CMP Polisher Market Shares                                    7-10

7.3     Worldwide CMP Slurry Market Forecast                                    7-12

7.4     Worldwide Slurry Market Shares                                               7-14

7.5     Worldwide CMP Pad Market Forecast                                        7-22

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